Customization: | Available |
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Usage: | Computer |
Type: | Wireless |
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Specification | ANet-1E1S1 | ANet-1E1S1 -LR |
ANet-1E1S1 -4G |
ANet-1E1S1 -4G/LR |
ANet-1E2S1 | ANet-1E2S1 -LR |
ANet-1E2S1 -4G |
ANet-1E2S1 -4G/LR |
ANet-2E4S1 | ANet-2E8S1 |
Uplink | CE | CE | CE, 4G | CE, 4G | CE | CE | CE, 4G | CE, 4G | CE | CE |
Downlink | RS485 | RS485, LORA | RS485 | RS485, LORA | RS485 | RS485, LORA | RS485 | RS485, LORA | RS485 | RS485 |
Ethernet port | 1 | 1 | 1 | 1 | 1 | 1 | 1 | 2 | 2 | |
Serial port | 1 | 1 | 1 | 2 | 2 | 2 | 2 | 4 | 8 |
Technical | Index |
Power Voltage | AC 85 V ~265 V |
Power Consumption | ≤10W |
Processing element | ARM32 digit Free scale ARM9 i.MX2xx 454MHz |
Inner board memory | 64MB DDR2 internal memory + 128MB NAND Flash + 8G SD Card Electronic hard disk |
Serial interface | Two channels coupling isolation RS485 |
Ethernet interface | 1 channel 10/100 self-adaption capacity |
SD card interface | Supports SD/MMC memory cards of not less than 512 M, supports hot-plug and plug-and-play breakpoints to continue data storage |
Safety | Power frequency withstand voltage: AC 2kV 1min between the communication terminal and auxiliary power supply |
Insulation resistance: input, output to shape>100MΩ | |
Environment | Working Temperature:-20ºC~+55ºC |
Storage Transport Temperature:-25ºC~+70ºC | |
Relative Humidity:≤95%(+25ºC) | |
Altitude:≤2500m | |
EMC Testing | IEC61000-4-2 ESD immunity test Class 4 |
IEC61000-4-4 Resistance test of electric fast transient pulse group Class 4 | |
IEC61000-4-5 Surge (shock) immunity test Class 4 | |
IEC61000-4-6 Conductive disturbance immunity of RF field induction Class 3 |